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Beilstein J. Nanotechnol. 2014, 5, 1334–1340, doi:10.3762/bjnano.5.146
Figure 1: a) Schematic diagram of experimental set-up for measuring laser-induced degradation due to irradiat...
Figure 2: a) Wavenumber spectra of reflected light from silica substrate for accumulated fluences F1 to F4, w...
Figure 3: Schematic diagram of pump–probe experimental set-up.
Figure 4: a) Instantaneous relative increase in reflected light intensity, ΔR, measured by pump–probe method....
Beilstein J. Nanotechnol. 2013, 4, 875–885, doi:10.3762/bjnano.4.99
Figure 1: (a) Schematic diagram of a dressed photon–phonon (DPP). (b–d) Schematic diagrams of DPP etching. Th...
Figure 2: Typical atomic force microscopy (AFM) images of a type-Ib diamond (111) substrate with a 5 μm × 5 μ...
Figure 3: AFM images of the GaN surface (a) before and (b) after DPP etching. (c) Enlarged view (1.0 μm × 1.0...
Figure 4: (a, b) Schematic diagrams of the DPP etching of substrates with nanostripe patterns. AFM images of ...
Figure 5: AFM images of the alumina substrate surface after RF sputtering (a) without and (b) with visible li...